An analysis of internal parameter variations effects on nanoscaled gates

Journal article (2008)

Authors

F Martorell External organisation
S.D. Cotofana Computer Engineering - EEMCS
Antonio Rubio External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2008

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering