System NEP Verification of a Wideband THz Direct Detector in CMOS

van Berkel, S.L.; Malotaux, E.S.; De Martino, C.; Spirito, M.; Cavallo, D.; Neto, A.; Llombart, Nuria

System NEP Verification of a Wideband THz Direct Detector in CMOS

Conference paper (2020)

Authors

S.L. van Berkel Tera-Hertz Sensing -

E.S. Malotaux Electronics -

C. De Martino Electronics -

M. Spirito Electronics -

D. Cavallo Tera-Hertz Sensing -

A. Neto Tera-Hertz Sensing -

Nuria Llombart Tera-Hertz Sensing -

Research Group

Electronics () (TU Delft)

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Published Date

2020

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics

Abstract

The predicted Noise Equivalent Power (NEP) of a THz direct detector is validated by means of a noise- and a system responsivity measurement. The direct detector consists of a double leaky slot lens antenna that operates from 200 GHz to 600 GHz in combination with a differential pair of Schottky Barrier Diodes (SBDs). The model is derived from low-frequency measurements.

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