Influence of trap states on dynamic properties of single grain silicon thin film transistors

Yan, F; Migliorato, P; Ishihara, R.

Influence of trap states on dynamic properties of single grain silicon thin film transistors

Journal article (2006)

Authors

F Yan External organisation

P Migliorato External organisation

R. Ishihara Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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2006

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Research Group

Electronic Components, Technology and Materials

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