Trends in tests and failure mechanisms in deep sub-micron technologies

Conference paper (2006)

Authors

S. Hamdioui Computer Engineering - EEMCS
Zaid Al-Ars Computer Engineering - EEMCS
L. Mhamdi Computer Engineering - EEMCS
GN Gaydadjiev Computer Engineering - EEMCS
S Vassiliadis Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2006

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering