Gamma processes and peaks-over-threshold distributions for time-dependent reliability

van Noortwijk, JM; van der Weide, J.A.M.; Kallen, MJ; Pandey, MD

Gamma processes and peaks-over-threshold distributions for time-dependent reliability

Journal article (2007)

Authors

JM van Noortwijk OLD Operations Research and Risk Analysis

J.A.M. van der Weide Applied Probability

MJ Kallen OLD Operations Research and Risk Analysis

MD Pandey OLD Operations Research and Risk Analysis

Research Group

OLD Operations Research and Risk Analysis

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Published Date

2007

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Research Group

OLD Operations Research and Risk Analysis