Stochastic analysis of deep-submicron CMOS process for reliable circuits designs

Zjajo, Amir; Tang, Q.; Pineda de Gyvez, J; Berkelaar, M.R.C.M.; Di Bucchianico, A; van der Meijs, N.P.

Stochastic analysis of deep-submicron CMOS process for reliable circuits designs

Journal article (2010)

Authors

Amir Zjajo Signal Processing Systems -

Q. Tang Signal Processing Systems -

J Pineda de Gyvez External organisation

M.R.C.M. Berkelaar Signal Processing Systems -

A Di Bucchianico External organisation

N.P. van der Meijs Signal Processing Systems -

Research Group

Signal Processing Systems () (TU Delft)

To reference this document use:

http://resolver.tudelft.nl/uuid:22d947bc-8d01-4b88-9e65-bea15affc4de

More Info

expand_more

Published Date

2010

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Signal Processing Systems