Simultaneous Correlative Scanning Electron and High-NA Fluorescence Microscopy

Liv Hamarat, N.; Zonnevylle, A.C.; Narvaez Gonzalez, A.C.; Effting, APJ; Voorneveld, PW; Lucas, MS; Hardwick, JC; Wepf, RA; Kruit, P.; Hoogenboom, Jacob P.

Simultaneous Correlative Scanning Electron and High-NA Fluorescence Microscopy

Journal article (2013)

Authors

N. Liv Hamarat ImPhys/Charged Particle Optics

A.C. Zonnevylle ImPhys/Charged Particle Optics

A.C. Narvaez Gonzalez ImPhys/Charged Particle Optics

APJ Effting External organisation

PW Voorneveld External organisation

MS Lucas External organisation

JC Hardwick External organisation

RA Wepf External organisation

P. Kruit ImPhys/Charged Particle Optics

Jacob P. Hoogenboom ImPhys/Charged Particle Optics

Research Group

ImPhys/Charged Particle Optics

To reference this document use:

http://resolver.tudelft.nl/uuid:21cde02c-bdcc-4dae-b0c0-2544be916d50

More Info

expand_more

Published Date

2013

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

ImPhys/Charged Particle Optics