Heterointerface effects on the charging energy of shallow D- Ground state in silicon: Role of dielectric mismatch

Journal article (2010)

Authors

M.J. Calderon External organisation
J. Verduijn QN/Photronic Devices
GP Lansbergen QN/Photronic Devices
GC Tettamanzi QN/Photronic Devices
S. Rogge QN/Photronic Devices
B Koiller External organisation
Research Group
QN/Photronic Devices
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Published Date

2010

Language

English

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Research Group

QN/Photronic Devices