Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology

Shakeri, S.M.; Hulsken, B; Van Vliet, L.J.; Stallinga, S.

Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology

Conference paper (2014)

Authors

S.M. Shakeri ImPhys/Quantitative Imaging

B Hulsken Philips Innovation Services

L.J. Van Vliet ImPhys/Quantitative Imaging

S. Stallinga ImPhys/Quantitative Imaging

Research Group

ImPhys/Quantitative Imaging

To reference this document use:

http://resolver.tudelft.nl/uuid:199d6743-fa60-43d8-ba04-17468f69035c

More Info

expand_more

Published Date

2014

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

ImPhys/Quantitative Imaging

Abstract

We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.