Surface roughness analysis of ETP-CVD a-Si:H thin films

Conference paper (2008)

Authors

M.A. Wank Photovoltaic Materials and Devices - EEMCS
R.A.C.M.M. van Swaaij Electronic Components, Technology and Materials - EEMCS
MCM van de Sanden External organisation
Research Group
Photovoltaic Materials and Devices (EEMCS) (TU Delft)
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Published Date

2008

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Electrical Sustainable Energy

Research Group

Photovoltaic Materials and Devices