A new sharpness measure based on Gaussian lines and edges

Dijk, J; van Ginkel, M; van Asselt, RJ; van Vliet, Lucas J.; Verbeek, P.W.

A new sharpness measure based on Gaussian lines and edges

Conference paper (2002)

Authors

J Dijk ImPhys/Quantitative Imaging

M van Ginkel ImPhys/Quantitative Imaging

RJ van Asselt External organisation

Lucas J. van Vliet ImPhys/Quantitative Imaging

P.W. Verbeek ImPhys/Quantitative Imaging

Research Group

ImPhys/Quantitative Imaging

Conference contrib. non-refer.

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Published Date

2002

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Research Group

ImPhys/Quantitative Imaging

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