System reliability in a stress-strength model

Conference paper (2002)

Authors

- Suyono Applied Probability - EEMCS
J.A.M. van der Weide Applied Probability - EEMCS
Research Group
Applied Probability (EEMCS) (TU Delft)
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Published Date

2002

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Delft Institute of Applied Mathematics

Research Group

Applied Probability